Accelerating ecosystem monitoring through computer vision with deep metric learning

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Authors

Yurika Oba, Hideyuki Doi

Abstract

Feature extraction from environmental observation data based on deep learning models has made significant progress. However, the current methods may not be optimal because of the increasing volume of data, complexity of data characteristics, and labeled data limitations. In this study, we focused on deep metric learning as a new application for environmental observation data to overcome these challenges. The extraction of features such as patterns and changes from large and complex environmental observation data using a deep metric learning approach may provide new opportunities for monitoring ecosystems experiencing unprecedented loads from climate change and human activities. We expect that deep metric learning will be a powerful tool for various ecosystem monitoring systems, from remote sensing of wide-area data to ecological data obtained through field surveys.

DOI

https://doi.org/10.32942/X2K031

Subjects

Biodiversity, Life Sciences

Keywords

ecosystem monitoring, deep metric learning, Few-Shot Learning, Zero-Shot Learning, remote sensing, field observation data

Dates

Published: 2024-07-19 12:04

License

CC BY Attribution 4.0 International

Additional Metadata

Language:
English

Conflict of interest statement:
None

Data and Code Availability Statement:
Not applicable